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IXDD404
Absolute Maximum Ratings (Note 1)
Operating Ratings
Parameter
Supply Voltage
Value
40 V
Param eter
Operating Tem perature Range
Value
-55 o C to 125 o C
8 Pin SOIC (SI) ( θ JA ) with heat sink** 71 o C/W
Heat sink area of 1cm
All Other Pins
Junction Temperature
Storage Temperature
Lead Temperature (10 sec)
-0.3 V to VCC + 0.3 V
150 oC
-65 oC to 150 oC
300 oC
Therm al Im pedance (Junction to Am bient)
8 Pin PDIP (PI) ( θ JA ) 120 o C/W
8 Pin SOIC (SIA) ( θ JA ) 110 o C/W
2
16 Pin SOIC (SIA-16) ( θ JA ) 110 o C/W
**Heat sink area is 1 oz. copper on one side of .06" thick
Electrical Characteristics
FR4 soldered to metal back plane.
Unless otherwise noted, T A = 25 o C, 4.5V ≤ V CC ≤ 35V .
All voltage measurements with respect to GND. IXDD404 configured as described in Test Conditions . All specifications are for one channel.
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
V IH
V IL
High input voltage
Low input voltage
4.5V ≤ V IN ≤ 18V
4.5V ≤ V IN ≤ 18V
2.5
0.8
V
V
V IN
Input voltage range
-5
V CC + 0.3
V
I IN
Input current
0V ≤ V IN ≤ V CC
-10
10
μ A
V OH
V OL
High output voltage
Low output voltage
V CC - 0.025
0.025
V
V
R OH
Output resistance
V CC = 18V
2
2.5
?
@ Output high
R OL
Output resistance
V CC = 18V
1.5
2
?
@ Output Low
I PEAK
I DC
Peak output current
Continuous output
V CC = 18V
4
1
A
A
current
V EN
Enable voltage range
- 0.3
Vcc + 0.3
V
V ENH
V ENL
High En Input Voltage
Low En Input Voltage
2/3 Vcc
1/3 Vcc
V
V
t R
t F
t ONDLY
Rise time
Fall time
On-time propagation
C L =1800pF Vcc=18V
C L =1800pF Vcc=18V
C L =1800pF Vcc=18V
16
13
36
18
17
40
ns
ns
ns
delay
t OFFDLY
Off-time propagation
C L =1800pF Vcc=18V
35
39
ns
delay
t ENOH
Enable to output high
30
ns
delay time
t DOLD
Disable to output low
30
ns
Disable delay time
V CC
I CC
Power supply voltage
Power supply current
V IN = 3.5V
V IN = 0V
4.5
18
1
0
35
3
10
V
mA
μ A
V IN = + V CC
10
μ A
R EN
Enable Pull-up Resistor
200
k ?
Specifications to change without notice
Note 1: Operating the device beyond parameters with listed “absolute maximum ratings” may cause permanent
damage to the device. Typical values indicate conditions for which the device is intended to be functional, but do not
guarantee specific performance limits. The guaranteed specifications apply only for the test conditions listed.
Exposure to absolute maximum rated conditions for extended periods may affect device reliability.
2
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